Handles large parts normally accommodated only by larger, more costly metrology systems!

Onyx Benchtop Automatic Optical Measurement System is accurate, strong, versatile and easy to use. This compact machine handles large parts normally accommodated only by larger, more costly metrology systems.

Onyx was designed using the latest solid modeling and Finite Element Analysis to achieve maximum system rigidity. Designed to fit on a benchtop, Onyx is secure on a stable, cast base.

The Onyx is powered by the AutoCheck and easy to use Basic-X Measurement Software. Basic-X was designed specifically for video measurement systems with motorized stages. With an extensive array of measurement tools, including the AutoFocus Motorized Zoom, intelligent edge detection, user friendly icons and a point and click interface, Basic-X makes it simple for everyone to get accurate, repeatable measurements. AutoCheck includes Windows 98. Windows NT or Windows 2000 are optional.
X-Y AXIS English Units Metric Units
X-Y travel distance 9" x 9" 230 mm x 230 mm
Scale resolution 0.000020" 0.50 µm
X-Y accuracy* E2=140 + 10L(in) µinch E2=3.5 + L(mm)/ 100 µm
Max travel velocity 4.3"/sec 110 mm/sec
Max acceleration & deceleration 7.9"/sec2 200 mm/sec2
Z-AXIS
Z travel distance 8.0" 200 mm
Scale resolution 0.000020" 0.50 µm
Z Axis accuracy* E1=160 + 10L(in) µinch E1=4 + L(mm)/ 100 µm
OPTICAL
Working distance 2.44" 60 mm
Magnification on 17" Monitor 35X to 180X
Field of View 0.395" to 0.066" 10 to 1.68 mm
PHYSICAL
Footprint, W x D 24.4" x 30.9" 620 x 785 mm
Overall dimensions, H x W x D 32.7" x 25.9" x 30.9" 830 x 660 x 785 mm
Weight 280 lbs 130 kg
Maximum workpiece weight 33 lbs 15 kg
Stage dimensions, W x D 17.25" x 15" 43.8 x 38.1 cm
ENVIRONMENTAL
Temperature, safe operating 5ºC - 40ºC, 41ºF - 104ºF
Temperature to meet specs 20ºC +/- 1ºC, 68ºF +/- 2ºF

*Applies to thermally stable system in rated environment, maximum zoom lens setting, and evenly distributed 5 kg load.

Depending on load distribution, accuracy at maximum rated load may be less than standard accuracy.

XY axis artifact: QVI 25 intersection grid reticle at standard measuring plane.   The standard measuring plane is defined as a plane that is 1" off of the work table.

Z axis artifact: QVI step gage. E1=Z measurement accuracy combines Autofocus and Z axis positioning capabilities.